منابع مشابه
10th Annual Lambda Alpha Symposium
Laura Bennett, Wichita State University Determining Burn Patterns Various studies and experiments were carried out to examine to what extent the skeletal remains of a burned body can provide information regarding the origin of a fire and the travel pattern of a fire. A secondary objective of this research project addressed a common conclusion that the human cranium will explode, once subjected ...
متن کامل10th FIG International Symposium on Deformation Measurements
Compared to opencut mining, underground coal mining is more common in Australia due to its lesser impact on the environment. Although there are several underground mining methods, such as the longwall, pillar, bord, and miniwall, longwall mining is the most commonly used method due to its high efficiency. However, longwall mining does lead to significant ground subsidence. Mining subsidence is ...
متن کامل10th Int'l Symposium on Quality Electronic Design
In this paper challenges observed in 65nm technology for circuits utilizing subthreshold region operation are presented. Different circuits are analyzed and simulated for ultra low supply voltages to find the best topology for subthreshold operation. To support the theoretical discussions different topologies are analyzed and simulated. Various aspects of flip-flop circuits are described in det...
متن کامل10th Int'l Symposium on Quality Electronic Design
In this paper, we propose a novel statistical decap allocation method to reduce the voltage drop noise in the presence of variational leakage current sources. The new method can derive the closed form of decoupling capacitance (decaps) in terms of variational parameters from the variational leakage currents. It treats the deterministic decap method as a black box and can work with any existing ...
متن کامل10th Int'l Symposium on Quality Electronic Design
On-chip circuit aging sources, like negative bias temperature instability (NBTI), hot-carrier injection (HCI), electromigration, and oxide breakdown, are reducing expected chip lifetimes. Being able to track the actual aging process is one way to avoid unnecessarily large design margins. This work proposes a sensing scheme that uses sets of reliability sensors capable of accurately tracking NBT...
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ژورنال
عنوان ژورنال: Mechanism and Machine Theory
سال: 1975
ISSN: 0094-114X
DOI: 10.1016/0094-114x(75)90033-6